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12

ICCAD
1990
IEEE

48views Hardware» more ICCAD 1990»

High-Level Delay Estimation for Technology-Independent Logic Equations

13 years 11 months ago

High-Level Delay Estimation for Technology-Independent Logic Equations

Download www.cse.hcmut.edu.vn

David E. Wallace, Mandalagiri S. Chandrasekhar

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12

ICCAD
1990
IEEE

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An Algorithm for Locating Logic Design Errors

13 years 11 months ago

An Algorithm for Locating Logic Design Errors

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Masahiro Tomita, Hong-Hai Jiang, Tamotsu Yamamoto,...

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16

ICCAD
1990
IEEE

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Exploiting the Special Structure of Conflict and Compatibility Graphs in High-Level Synthesis

13 years 11 months ago

Exploiting the Special Structure of Conflict and Compatibility Graphs in High-Level Synthesis

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D. L. Springer, Donald E. Thomas

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12

ICCAD
1990
IEEE

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Parallel Simulation Algorithms for Grid-Based Analog Signal Processors

13 years 11 months ago

Parallel Simulation Algorithms for Grid-Based Analog Signal Processors

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Luis Miguel Silveira, Andrew Lumsdaine, Jacob Whit...

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15

ICCAD
1990
IEEE

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Partial Detectability Profiles

13 years 11 months ago

Partial Detectability Profiles

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Partial detectability profiles are formed by randomly sampling each fault's detectability and are used in estimating the fault coverage of random input test vectors on combin...

Paul G. Ryan, W. Kent Fuchs

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17

ICCAD
1990
IEEE

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Floorplanning with Pin Assignment

13 years 11 months ago

Floorplanning with Pin Assignment

Download atrak.usc.edu

We present a hierarchicaltechniquefor floorplanning and pin assignment of the general cell layouts. Given a set of cells with their shape lists, a layout aspect ratio, relative po...

Massoud Pedram, Malgorzata Marek-Sadowska, Ernest ...

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12

ICCAD
1990
IEEE

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A New Method for Assigning Signal Flow Directions to MOS Transistors

13 years 11 months ago

A New Method for Assigning Signal Flow Directions to MOS Transistors

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Kuen-Jong Lee, Rajiv Gupta, Melvin A. Breuer

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14

ICCAD
1990
IEEE

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An Integrated Hot-Carrier Degradation Simulator for VLSI Reliability Analysis

13 years 11 months ago

An Integrated Hot-Carrier Degradation Simulator for VLSI Reliability Analysis

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Yusuf Leblebici, Sung-Mo Kang

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13

ICCAD
1990
IEEE

59views Hardware» more ICCAD 1990»

Partitioning of Functional Models of Synchronous Digital Systems

13 years 11 months ago

Partitioning of Functional Models of Synchronous Digital Systems

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Rajesh K. Gupta, Giovanni De Micheli

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11

ICCAD
1990
IEEE

47views Hardware» more ICCAD 1990»

Observability Don't Care Sets and Boolean Relations

13 years 11 months ago

Observability Don't Care Sets and Boolean Relations

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Maurizio Damiani, Giovanni De Micheli

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