ETS
2009
IEEE
2009
IEEE
Increasing Robustness of SAT-based Delay Test Generation Using Efficient Dynamic Learning Techniques
13 years 10 months ago
Due to the increased speed in modern designs, testing for delay faults has become an important issue in the postproduction test of manufactured chips. A high fault coverage is nee...
ICCAD
2010
IEEE
13 years 10 months ago
2010
IEEE
Extreme technology scaling in silicon devices drastically affects reliability, particularly because of runtime failures induced by transistor wearout. Currently available online t...
TCAD
2002
14 years 2 days ago
2002
This paper introduces the concept of hierarchical cellular automata (HCA). The theory of HCA is developed over the Galois extension field (2 ), where each cell of the CA can store ...
ET
1998
14 years 3 days ago
1998
This paper explores the design of efficient test sets and test-pattern generators for online BIST. The target applications are high-performance, scalable datapath circuits for whi...
ET
2002
14 years 7 days ago
2002
The combination of higher quality requirements and sensitivity of high performance circuits to delay defects has led to an increasing emphasis on delay testing of VLSI circuits. A...
INTEGRATION
2006
14 years 12 days ago
2006
Improving testability during the early stages of high-level synthesis has several benefits including reduced test hardware overheads, reduced test costs, reduced design iterations...
FTCS
1993
14 years 1 months ago
1993
We present a new test response compression method called cumulative balance testing (CBT)that extends both balance testing and accumulatorcompression testing. CBT uses an accumulat...
FORTE
2000
14 years 1 months ago
2000
The paper addresses the problem of test derivation from partially defined specifications. A specification is modeled by an Input/Output FSM such that transitions from some states ...
DSD
2005
IEEE
14 years 2 months ago
2005
IEEE
Several methods improving the fault coverage in mixed-mode BIST are presented in this paper. The test is divided into two phases: the pseudo-random and deterministic. Maximum of f...
VTS
1995
IEEE
14 years 4 months ago
1995
IEEE
This paper presents a new approach for on-chip test pattern generation. The set of test patterns generated by a pseudo-random pattern generator (e.g., an LFSR) is transformed into...