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29

ISQED
2005
IEEE

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Power Reduction in Test-Per-Scan BIST with Supply Gating and Efficient Scan Partitioning

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Power Reduction in Test-Per-Scan BIST with Supply Gating and Efficient Scan Partitioning

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Swarup Bhunia, Hamid Mahmoodi-Meimand, Debjyoti Gh

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Added	25 Jun 2010
Updated	25 Jun 2010
Type	Conference
Year	2005
Where	ISQED
Authors	Swarup Bhunia, Hamid Mahmoodi-Meimand, Debjyoti Ghosh, Kaushik Roy

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