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Sci2ools
DATE
2000
IEEE
2000
IEEE
Reducing the Complexity of Defect Level Modeling Using the Clustering Effect
Real-time Traffic| Added | 30 Jul 2010 |
| Updated | 30 Jul 2010 |
| Type | Conference |
| Year | 2000 |
| Where | DATE |
| Authors | José T. de Sousa, Vishwani D. Agrawal |
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