A Roadmap for Boundary-Scan Test Reuse

This paper proposes a Layered Model for boundaryscan testing to help identify opportunities for standardization. Serial Vector Format [1] and an accompanying Application Programming Interface, developed for the Application Specific Electronic Module (ASEM) project sponsored by ARPA, are presented as examples of a novel approach to the representation of standards for the ATE industry.

• Type: Conference
• Year: 1996
• Where: ITC
• Authors: D. Eugene Wedge, Tom Conner
• Keywords: Application Programming Interface, Hardware, ITC 1996, Serial Vector Format, Specific Electronic Module