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» A Roadmap for Boundary-Scan Test Reuse
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ITC
1996
IEEE
96views Hardware» more  ITC 1996»
14 years 2 months ago
A Roadmap for Boundary-Scan Test Reuse
This paper proposes a Layered Model for boundaryscan testing to help identify opportunities for standardization. Serial Vector Format [1] and an accompanying Application Programmi...
D. Eugene Wedge, Tom Conner
DATE
2006
IEEE
94views Hardware» more  DATE 2006»
14 years 4 months ago
Reuse-based test access and integrated test scheduling for network-on-chip
In this paper, we propose a new method for test access and test scheduling in NoC-based system. It relies on a progressive reuse of the network resources for transporting test dat...
Chunsheng Liu, Zach Link, Dhiraj K. Pradhan
ACSAC
2010
IEEE
13 years 8 months ago
Multi-vendor penetration testing in the advanced metering infrastructure
- The advanced metering infrastructure (AMI) is revolutionizing electrical grids. Intelligent AMI "smart meters" report real time usage data that enables efficient energy...
Stephen E. McLaughlin, Dmitry Podkuiko, Sergei Mia...
DAC
2002
ACM
14 years 11 months ago
Embedded software-based self-testing for SoC design
At-speed testing of high-speed circuits is becoming increasingly difficult with external testers due to the growing gap between design and tester performance, growing cost of high...
Angela Krstic, Wei-Cheng Lai, Kwang-Ting Cheng, Li...