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    Robust test generation for power supply noise induced path delay faults

    14 years 2 months ago
    Robust test generation for power supply noise induced path delay faults
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    Xiang Fu, Huawei Li, Yu Hu, Xiaowei Li
    claim paper
    Added 12 Oct 2010
    Updated 12 Oct 2010
    Type Conference
    Year 2008
    Where ASPDAC
    Authors Xiang Fu, Huawei Li, Yu Hu, Xiaowei Li
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