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DATE
2003
IEEE
2003
IEEE
RTL Test Pattern Generation for High Quality Loosely Deterministic BIST
Real-time Traffic| Added | 04 Jul 2010 |
| Updated | 04 Jul 2010 |
| Type | Conference |
| Year | 2003 |
| Where | DATE |
| Authors | Marcelino B. Santos, José M. Fernandes, Isabel C. Teixeira, João Paulo Teixeira |
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