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Screening MinVDD Outliers Using Feed-Forward Voltage Testing

15 years 8 months ago
Screening MinVDD Outliers Using Feed-Forward Voltage Testing
Robert Madge, B. H. Goh, V. Rajagopalan, C. Macchi
Added 15 Jul 2010
Updated 15 Jul 2010
Type Conference
Year 2002
Where ITC
Authors Robert Madge, B. H. Goh, V. Rajagopalan, C. Macchietto, W. Robert Daasch, Chris Schuermyer, C. Taylor, David Turner
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