A Self-Test Approach Using Accumulators as Test Pattern Generators

: Configurations of adders and registers, which are available in tnany datapaths, can be utilized to generate pattems and to compact test responses. Thispaper unalyzes tlie patiern sequences produced by different types of accuriiulators and shows that they can achieve similar ,fault coverage aspseudo-randompatterns. Corizpared to file well-known selftest tnethods that insert test registers, the approach using accumulators saves the additional gates that are needed to iniplenient test registers, and it avoids pecfortnunce degracilition diw to atitiitionnl d e l q x

• Type: Conference
• Year: 1995
• Where: ISCAS
• Authors: Albrecht P. Stroele
• Keywords: Hardware, Iniplenient Test Registers, ISCAS 1995, Test Registers, Tlie Patiern Sequences