A sigma-delta modulation based BIST scheme for mixed-signal circuits

In this work, we present the analysis of a built-in self-test (BIST) scheme for mixed-signal circuits that is intended to provide on-chip stimulus generation and response analysis. Based on the sigma-delta modulation principle, the proposed scheme can produce high-quality stimuli and obtain accurate measurements without the need of precise analog circuitry. Numerical simulations are conducted to validate our idea and the results show that the scheme is a promising BIST approach for mixed-signal circuits.

• Type: Conference
• Year: 2000
• Where: ASPDAC
• Authors: Jiun-Lang Huang, Kwang-Ting Cheng
• Keywords: ASPDAC 2000, Hardware, Mixed-signal Circuits, On-chip Stimulus Generation, Promising Bist Approach