Test Data Compression Using Efficient Bitmask and Dictionary Selection Methods

Abstract--Higher circuit densities in system-on-chip (SOC) designs have led to drastic increase in test data volume. Larger test data size demands not only higher memory requirements, but also an increase in testing time. Test data compression addresses this problem by reducing the test data volume without affecting the overall system performance. This paper proposes a novel test data compression technique using bitmasks which provides a substantial improvement in the compression efficiency without introducing any additional decompression penalty. The major contributions of this paper are as follows: 1) it develops an efficient bitmask selection technique for test data in order to create maximum matching patterns; 2) it develops an efficient dictionary selection method which takes into account the bitmask based compression; and 3) it proposes a test compression technique using efficient dictionary and bitmask selection to significantly reduce the testing time and memory requirements. W...

• Type: Journal
• Year: 2010
• Where: TVLSI
• Authors: Kanad Basu, Prabhat Mishra
• Keywords: Artificial Intelligence, Test Data, Test Data Compression, Test Data Volume, TVLSI 2010