TVLSI
2010
13 years 9 months ago
2010
Abstract--Higher circuit densities in system-on-chip (SOC) designs have led to drastic increase in test data volume. Larger test data size demands not only higher memory requiremen...
TC
2002
14 years 1 months ago
2002
DFT
2005
IEEE
14 years 4 months ago
2005
IEEE
Linear decompressors are the dominant methodology used in commercial test data compression tools. However, they are generally not able to exploit correlations in the test data, an...
ICCAD
2007
IEEE
14 years 6 months ago
2007
IEEE
Abstract-- In this paper, we propose a novel test data compression technique named CacheCompress, which combines selective encoding and dynamic dictionary based encoding. Depending...
ASPDAC
2007
ACM
14 years 6 months ago
2007
ACM
1 The low throughput at IC (Integrated Circuit) testing is mainly due to the increasing test data volume, which leads to high ATE (Automatic Test Equipment) memory requirements and...
DATE
2002
IEEE
14 years 7 months ago
2002
IEEE
We present a new test resource partitioning (TRP) technique for reduced pin-count testing of system-on-a-chip (SOC). The proposed technique is based on test data compression and o...
VTS
2003
IEEE
14 years 7 months ago
2003
IEEE
—We present a dictionary-based test data compression approach for reducing test data volume and testing time in SOCs. The proposed method is based on the use of a small number of...
ITC
2003
IEEE
14 years 7 months ago
2003
IEEE
This paper describes a Hybrid DFT (H-DFT) architecture for low-cost, high quality structural testing in the high volume manufacturing (HVM) environment. This structure efficiently...
DATE
2003
IEEE
14 years 7 months ago
2003
IEEE
Test data compression (TDC) is a promising low-cost methodology for System-on-a-Chip (SOC) test. This is due to the fact that it can reduce not only the volume of test data but al...
ISVLSI
2008
IEEE
14 years 8 months ago
2008
IEEE
Re-using the network in a NoC-based system as a test access mechanism is an attractive solution as pointed out by several authors. As a consequence, testing of NoC-based SoCs is b...