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32

VTS
2003
IEEE

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Test Resource Partitioning and Optimization for SOC Designs

14 years 4 months ago

Test Resource Partitioning and Optimization for SOC Designs

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1 We propose a test resource partitioning and optimization technique for core-based designs. Our technique includes test set selection and test resource ﬂoor-planning with the aim of minimizing the total test application time and the routing of the added TAM (test access mechanism) wires. A feature of our approach is that it pinpoints bottlenecks that are likely to limit the test solution, which is important in the iterative test solution development process. We demonstrate the usefulness of the technique through a comparison with a test scheduling and TAM design tool.

Erik Larsson, Hideo Fujiwara

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Technique Includes Test | Test Resource | Test Resource Partitioning | VTS 2003 |

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Added	05 Jul 2010
Updated	05 Jul 2010
Type	Conference
Year	2003
Where	VTS
Authors	Erik Larsson, Hideo Fujiwara

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