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A testability metric for path delay faults and its application

15 years 7 months ago
A testability metric for path delay faults and its application
Huan-Chih Tsai, Kwang-Ting Cheng, Vishwani D. Agra
Added 01 Aug 2010
Updated 01 Aug 2010
Type Conference
Year 2000
Where ASPDAC
Authors Huan-Chih Tsai, Kwang-Ting Cheng, Vishwani D. Agrawal
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