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    A testability metric for path delay faults and its application

    14 years 4 months ago
    A testability metric for path delay faults and its application
    Download  cadlab.ece.ucsb.edu
    Huan-Chih Tsai, Kwang-Ting Cheng, Vishwani D. Agra
    claim paper
    Added 01 Aug 2010
    Updated 01 Aug 2010
    Type Conference
    Year 2000
    Where ASPDAC
    Authors Huan-Chih Tsai, Kwang-Ting Cheng, Vishwani D. Agrawal
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