TIGUAN: Thread-Parallel Integrated Test Pattern Generator Utilizing Satisfiability ANalysis

We present the automatic test pattern generator TIGUAN based on a thread-parallel SAT solver. Due to a tight integration of the SAT engine into the ATPG algorithm and a carefully chosen mix of various optimization techniques, multi-million-gate industrial circuits can be handled without aborts. TIGUAN supports both conventional single-stuck-at faults and sophisticated conditional multiple stuck-at faults which allows to generate patterns for non-standard fault models.

• Type: Conference
• Year: 2009
• Where: VLSID
• Authors: Alejandro Czutro, Ilia Polian, Matthew D. T. Lewis, Piet Engelke, Sudhakar M. Reddy, Bernd Becker
• Keywords: Computer Aided Design, Conventional Single-stuck-at Faults, Multiple Stuck-at Faults, Thread-parallel Sat Solver, VLSID 2009