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    Transparent Memory Testing for Pattern-Sensitive Faults

    14 years 4 months ago
    Transparent Memory Testing for Pattern-Sensitive Faults
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    Mark G. Karpovsky, Vyacheslav N. Yarmolik
    claim paper
    Added 09 Aug 2010
    Updated 09 Aug 2010
    Type Conference
    Year 1994
    Where ITC
    Authors Mark G. Karpovsky, Vyacheslav N. Yarmolik
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