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ITC
1994
IEEE

Transparent Memory Testing for Pattern-Sensitive Faults

14 years 3 months ago
Transparent Memory Testing for Pattern-Sensitive Faults
Mark G. Karpovsky, Vyacheslav N. Yarmolik
Added 09 Aug 2010
Updated 09 Aug 2010
Type Conference
Year 1994
Where ITC
Authors Mark G. Karpovsky, Vyacheslav N. Yarmolik
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