TuneLogic: Post-silicon tuning of dual-Vdd designs

Modern CMOS manufacturing processes have significant variability, which necessitates guard banding to achieve reasonable yield. It is our thesis that variability should be addressed post-manufacturing. The fundamental contribution we make is a dual-Vdd design style, and associated CAD algorithms, wherein we assign supply voltages to logic based on post-manufacturing analysis rather than designing with nominal values and guard banding. We perform a detailed case study of a custom designed pipelined multiplier using realistic process data. Our results show that for comparable yield and target delay, we can achieve significantly less power than a single-Vdd supply. For example, to achieve 100% yield at same target delay, TuneLogic uses 23.6 pJ/multiply while a single-Vdd design uses 34.6 pJ/multiply. Keywords Process Variation, Tuning, Configurability, Yield, Delay

• Type: Conference
• Year: 2009
• Where: ISQED
• Authors: Stephen Bijansky, Sae Kyu Lee, Adnan Aziz
• Keywords: Guard Banding, Hardware, ISQED 2009, Reasonable Yield, Target Delay