—As device feature size continues to shrink, reliability becomes a severe issue due to process variation, particle-induced transient errors, and transistor wear-out/stress such a...
Jin Sun, Avinash Karanth Kodi, Ahmed Louri, Janet ...
— With continued scaling, reliability is emerging as a critical challenge for the designers of digital circuits. The challenge stems in part from the lack of computationally efï¬...
The advance in semiconductor technologies presents the serious problem of parameter variations. They affect threshold voltage of transistors and thus circuit delay has variability...
In this paper we propose a technique to determine accurate interconnect extraction corners for a 65-nm design using parametric RC extraction and timing analysis. We calculate the ...
Ayhan A. Mutlu, Jiayong Le, Ruben Molina, Mustafa ...
Abstract — Nanoelectronic design faces unprecedented reliability challenges and must achieve noise immunity and delay insensitiveness in the presence of prevalent defects and sig...
In this paper challenges observed in 65nm technology for circuits utilizing subthreshold region operation are presented. Different circuits are analyzed and simulated for ultra lo...
Farshad Moradi, Dag T. Wisland, Hamid Mahmoodi, Al...
Active decoupling capacitors (decaps) are more effective than passive decaps at reducing local IR-drop problems in the power distribution network. In the basic active decap, two p...