Tutorial: Characterizing SDRAMS

This paper presents characterization methods for an SDRAM in a manufacturing environment. Contact tests, dc tests, basic functional tests, signal margin tests and retention characterization are shown. Measurement of the cell signal is used as an example for pico probing. Special test modes for SDRAMs which can be used to aid characterization and failure analysis (FA) are discussed.

• Type: Conference
• Year: 1999
• Where: MTDT
• Authors: Jörg E. Vollrath
• Keywords: Basic Functional Tests, Hardware, MTDT 1999, Paper Presents Characterization, Signal Margin Tests