Validation and test generation for oscillatory noise in VLSI interconnects

: Inductance of on-chip interconnects gives rise to signal overshoots and undershoots that can cause logic errors. By considering technology trends, we show that in 0.13

• Type: Conference
• Year: 1999
• Where: ICCAD
• Authors: Arani Sinha, Sandeep K. Gupta, Melvin A. Breuer
• Keywords: Hardware, ICCAD 1999, Inductance Induced Oscillation, Interconnects Gives Rise, Logic Errors