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ICCAD
1999
IEEE

72views Hardware» more ICCAD 1999»

Validation and test generation for oscillatory noise in VLSI interconnects

14 years 3 months ago

: Inductance of on-chip interconnects gives rise to signal overshoots and undershoots that can cause logic errors. By considering technology trends, we show that in 0.13

Arani Sinha, Sandeep K. Gupta, Melvin A. Breuer

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