We show that timed automata can be used to model and to analyze timeliness properties of embedded system architectures. Using a case study inspired by industrial practice, we pres...
The use of a single pass/fail threshold for IDDQ testing is unworkable as chip background currents increase to the point where they exceed many defect currents. This paper describ...
Peter C. Maxwell, Pete O'Neill, Robert C. Aitken, ...
In this paper we present an input pattern independent method to compute the maximum current envelope, which is an upper bound over all possible current waveforms drawn by a circui...
We are exploring the differences between expert and less expert tutors with two goals: cognitive (what does tutoring tell us about learning) and applied (which features of tutorin...
Barbara Di Eugenio, Trina C. Kershaw, Xin Lu, Andr...
Lossy transmission over a relay channel in which the relay has access to correlated side information is considered. First, a joint source-channel decode-and-forward scheme is propo...