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GLVLSI
2007
IEEE
194views VLSI» more  GLVLSI 2007»
13 years 11 months ago
Probabilistic maximum error modeling for unreliable logic circuits
Reliability modeling and evaluation is expected to be one of the major issues in emerging nano-devices and beyond 22nm CMOS. Such devices would have inherent propensity for gate f...
Karthikeyan Lingasubramanian, Sanjukta Bhanja
NAR
2011
252views Computer Vision» more  NAR 2011»
12 years 10 months ago
BISC: Binary SubComplexes in proteins database
Binary subcomplexes in proteins database (BISC) is a new protein–protein interaction (PPI) database linking up the two communities most active in their characterization: structu...
Thomas Juettemann, Dietlind L. Gerloff
IDEAS
2003
IEEE
86views Database» more  IDEAS 2003»
14 years 25 days ago
A Medium Complexity Discrete Model for Uncertain Spatial Data
This paper presents a method for representing uncertainty in spatial data in a database. The model presented requires moderate amounts of storage space. To compute the probability...
Erlend Tøssebro, Mads Nygård
VLSID
2009
IEEE
87views VLSI» more  VLSID 2009»
14 years 8 months ago
Soft Error Rates with Inertial and Logical Masking
We analyze the neutron induced soft error rate (SER). An induced error pulse is modeled by two parameters, probability of occurrence and probability density function of the pulse ...
Fan Wang, Vishwani D. Agrawal
CVPR
2004
IEEE
14 years 9 months ago
Learning Distance Functions for Image Retrieval
Image retrieval critically relies on the distance function used to compare a query image to images in the database. We suggest to learn such distance functions by training binary ...
Tomer Hertz, Aharon Bar-Hillel, Daphna Weinshall