833 search results - page 33 / 167 » A Design and Test Technique for Embedded Software |
117
click to vote
DSD
2006
IEEE
15 years 10 months ago
2006
IEEE
Traditionally, an embedded system design process demands a considerable amount of expertise, time and money. This makes developing embedded systems difficult for many companies, a...
129
click to vote
DATE
2006
IEEE
15 years 10 months ago
2006
IEEE
Ever-increasing integrated circuit (IC) power densities and peak temperatures threaten reliability, performance, and economical cooling. To address these challenges, thermal analy...
157
click to vote
TCAD
2011
14 years 11 months ago
2011
—This paper presents a hybrid automatic test pattern generation (ATPG) technique using the staggered launch-oncapture (LOC) scheme followed by the one-hot LOC scheme for testing ...
124
click to vote
ASYNC
2005
IEEE
15 years 9 months ago
2005
IEEE
A Globally Asynchronous - Locally Synchronous (GALS) technique for application in wireless communication systems is proposed and evaluated. The GALS wrappers are based on a reques...
125
click to vote
ICFEM
2003
Springer
15 years 9 months ago
2003
Springer
Abstract. Errors in a requirements model have prolonged detrimental effects on reliability, cost, and safety of a software system. It is very costly to fix these errors in later ...