We present the development of T-UPPAAL — a new tool for online black-box testing of real-time embedded systems from non-deterministic timed automata specifications. It is based ...
Kim Guldstrand Larsen, Marius Mikucionis, Brian Ni...
— During volume testing, test application time, test data volume and high performance automatic test equipment (ATE) are the major cost factors. Embedded testing including builti...
We describe input devices and two-handed interaction techniques to support map navigation tasks. We discuss several design variations and user testing of two-handed navigation tec...
Exploiting instruction-level parallelism (ILP) is extremely important for achieving high performance in application specific instruction set processors (ASIPs) and embedded process...
Ramaswamy Govindarajan, Erik R. Altman, Guang R. G...
Test case generation is an expensive, tedious, and errorprone process in software testing. In this paper, test case generation is accomplished using an Extended Finite State Machi...