A diagnosis algorithm for extreme space compaction

— During volume testing, test application time, test data volume and high performance automatic test equipment (ATE) are the major cost factors. Embedded testing including builtin self-test (BIST) and multi-site testing are quite effective cost reduction techniques which may make diagnosis more complex. This paper presents a test response compaction scheme and a corresponding diagnosis algorithm which are especially suited for BIST and multi-site testing. The experimental results on industrial designs show, that test time and response data volume reduces significantly and the diagnostic resolution even improves with this scheme. A comparison with X-Compact indicates, that simple parity information provides higher diagnostic resolution per response data bit than more complex signatures. Keywords— Diagnosis, Embedded diagnosis, Multi-site test, Compaction, Design-for-test

• Type: Conference
• Year: 2009
• Where: DATE
• Authors: Stefan Holst, Hans-Joachim Wunderlich
• Keywords: DATE 2009, Hardware, Multi-site Testing, Test Data Volume, Test Response Compaction