In this paper a new solution is proposed for testing simple stwo stage electronic circuits. It minimizes the number of tests to be performed to determine the genuinity of the circ...
In this work a method to improve the loopback test used in RF analog circuits is described. The approach is targeted to the SoC environment, being able to reuse system resources i...
Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Su...
Abstract. Consider a weighted and undirected graph, possibly with self-loops, and its corresponding Laplacian matrix, possibly augmented with additional diagonal elements correspon...
We present the Self-Loop Aggregation Product (SLAP), a new hybrid technique that replaces the synchronized product used in the automata-theoretic approach for LTL model checking. T...
In this paper, we present a new voltage IR drop analysis approach for large on-chip power delivery networks. The new approach is based on recently proposed sampling based reductio...