326 search results - page 64 / 66 » A Library of Algorithms for Graph Drawing |
ICCAD
2006
IEEE
14 years 4 months ago
2006
IEEE
Soft errors in logic are emerging as a significant reliability problem for VLSI designs. This paper presents novel circuit optimization techniques to mitigate soft error rates (SE...
ISPD
2007
ACM
13 years 9 months ago
2007
ACM
When VLSI technology scales toward 45nm, the lithography wavelength stays at 193nm. This large gap results in strong refractive effects in lithography. Consequently, it is a huge...
BMCBI
2008
13 years 7 months ago
2008
Background: High-throughput methods that allow for measuring the expression of thousands of genes or proteins simultaneously have opened new avenues for studying biochemical proce...
CVPR
2012
IEEE
11 years 9 months ago
2012
IEEE
Depth ordering is instrumental for understanding the 3D geometry of an image. We as humans are surprisingly good ordering even with abstract 2D line drawings. In this paper we pro...
BMCBI
2007
13 years 7 months ago
2007
Background: Construction and interpretation of phylogenetic trees has been a major research topic for understanding the evolution of genes. Increases in sequence data and complexi...