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DAC
2007
ACM
14 years 9 months ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
GECCO
2004
Springer
164views Optimization» more  GECCO 2004»
14 years 1 months ago
Fuzzy Dominance Based Multi-objective GA-Simplex Hybrid Algorithms Applied to Gene Network Models
Hybrid algorithms that combine genetic algorithms with the Nelder-Mead simplex algorithm have been effective in solving certain optimization problems. In this article, we apply a s...
Praveen Koduru, Sanjoy Das, Stephen Welch, Judith ...
APSEC
2003
IEEE
14 years 1 months ago
Understanding How the Requirements Are Implemented in Source Code
For software maintenance and evolution, a common problem is to understand how each requirement is implemented in the source code. The basic solution of this problem is to find the...
Wei Zhao, Lu Zhang, Yin Liu, Jing Luo, Jiasu Sun
IRI
2008
IEEE
14 years 2 months ago
Model check stochastic supply chains
—Supply chain [2], [6] is an important component of business operations. Understanding its stochastic behaviors is the key to risk analysis and performance evaluation in supply c...
Li Tan, Shenghan Xu
SIGSOFT
2006
ACM
14 years 2 months ago
Memories of bug fixes
The change history of a software project contains a rich collection of code changes that record previous development experience. Changes that fix bugs are especially interesting, ...
Sunghun Kim, Kai Pan, E. James Whitehead Jr.