— With continued scaling, reliability is emerging as a critical challenge for the designers of digital circuits. The challenge stems in part from the lack of computationally efï¬...
Abstract—We propose the use of the logic S1S as a mathematical framework for studying the synthesis of sequential designs. We will show that this leads to simple and mathematical...
Adnan Aziz, Felice Balarin, Robert K. Brayton, Alb...
We show how to combine the two most powerful approaches for automated termination analysis of logic programs (LPs): the direct approach which operates directly on LPs and the trans...
During built-in self-test (BIST), the set of patterns generated by a pseudo-random pattern generator may not provide a sufficiently high fault coverage. This paper presents a new ...
With technology scaling, the occurrence rate of not only single, but also multiple transients resulting from a single hit is increasing. In this work, we consider the effect of th...