Electrical Modeling for High Bandwidth IO Link Chirayu Amin, Chandramouli Kashyap ¬ Intel Corp., Hillsboro, OR Prateek Bhansali ¬ Univ. of Minnesota, Mi...
Debasish Das, William Scott, Shahin Nazarian, Hai ...
NBTI is one of the most important silicon reliability problems facing processor designers today. The impact of NBTI can be mitigated at both the circuit and microarchitecture leve...
While model based design of platform independent application logic has already shown significant success, the design of platform independent user interfaces still needs further in...
Parallel test application helps reduce the otherwise considerable test times in SOCs; yet its applicability is limited by average and peak power considerations. The typical test v...
Ozgur Sinanoglu, Ismet Bayraktaroglu, Alex Orailog...
Security enforcement framework is an important aspect of any distributed system. With new requirements imposed by SOA-based business models, adaptive security enforcement on the a...
Ivan Djordjevic, Srijith K. Nair, Theodosis Dimitr...