432 search results - page 5 / 87 » A Methodology for Designing and Dimensioning Critical Comple... |
DAC
1995
ACM
13 years 11 months ago
1995
ACM
The paper describes the evolution of an Interdisciplinary Concurrent Design Methodology (ICDM) and the metrics used to compare four generations of wearable computer artifacts prod...
DAC
2004
ACM
14 years 8 months ago
2004
ACM
Resolution enhancement techniques (RET) such as optical proximity correction (OPC) and phase-shift mask (PSM) technology are deployed in modern processes to increase the fidelity ...
GI
2004
Springer
14 years 25 days ago
2004
Springer
: The transition from microelectronics to nanoelectronics reaches physical limits and results in a paradigm shift in the design and fabrication of electronic circuits. The conserva...
ASAP
1997
IEEE
13 years 11 months ago
1997
IEEE
Improvements in semiconductor integration density and the resulting problem of having to manage designs of increasing complexity is an old one, but still current. The new challeng...
GI
2003
Springer
14 years 19 days ago
2003
Springer
: Our current societies are fully dependent on large complex critical infrastructures (LCCIs). These LCCIs are large scale distributed systems that are highly interdependent, both ...