5 search results - page 1 / 1 » A Nanostructual Microwave Probe Used for Atomic Force Micros... |
CORR
2008
Springer
13 years 8 months ago
2008
Springer
IROS
2006
IEEE
14 years 2 months ago
2006
IEEE
— The development of a mechanical force sensing device system based on force/vision feedback control for exploring in vitro the contact mechanics of human adherent cervix Epithel...
SI3D
1995
ACM
14 years 1 days ago
1995
ACM
The NanoManipulator system has been expanded from a virtualreality interface for a specific scanning tunneling microscope to include control of atomic force microscopes. The curre...
ICRA
2007
IEEE
14 years 2 months ago
2007
IEEE
— In this paper, a strategy for controlled pushing is presented for microassembly of 4.5 μm polystyrene particles on a flat glass substrate using an atomic force microscope prob...
ICRA
2005
IEEE
14 years 2 months ago
2005
IEEE
Abstract— Nanomanipulation using Atomic Force Microscope (AFM) has been extensively investigated for many years. However, control of tip position during nanomanipulation is still...