Modeling and Control of Active End Effector for the AFM Based Nano Robotic Manipulators

Abstract— Nanomanipulation using Atomic Force Microscope (AFM) has been extensively investigated for many years. However, control of tip position during nanomanipulation is still a major issue because of the deformation of the cantilever caused by manipulation force. The softness of the conventional cantilevers also cause the failure of the manipulation of relatively large and sticky nano-object because the tip can easily slip over the nano-object. In this paper, an active atomic force microscopy probe is used to solve these problems by changing the cantilever’s flexibility or rigidity through different control strategies in imaging and manipulation modes respectively. During imaging mode, the active probe is controlled to bend up with respect to the interaction force between the tip and samples, thus making the tip response faster and increase the imaging speed. During manipulation mode, the active probe is controlled to bend down with respect to the interaction force between tip...

• Type: Conference
• Year: 2005
• Where: ICRA
• Authors: Jiangbo Zhang, Guangyong Li, Ning Xi
• Keywords: Active Probe, Atomic Force, ICRA 2005, Manipulation Mode, Robotics