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ECSQARU
2007
Springer
14 years 1 months ago
Information Affinity: A New Similarity Measure for Possibilistic Uncertain Information
Abstract. This paper addresses the issue of measuring similarity between pieces of uncertain information in the framework of possibility theory. In a first part, natural properties...
Ilyes Jenhani, Nahla Ben Amor, Zied Elouedi, Salem...
IBPRIA
2007
Springer
14 years 1 months ago
New Measure for Shape Elongation
Shape elongation is one of the basic shape descriptors that has a very clear intuitive meaning. That is reason for its applicability in many shape classification tasks. In this pap...
Milos Stojmenovic, Jovisa D. Zunic
3DPVT
2004
IEEE
119views Visualization» more  3DPVT 2004»
14 years 29 days ago
Synthetic Image of Multiresolution Sketch Leads to New Features
A new approach to construction of robust features is proposed and applied to an instance of the correspondence problem. The main idea is to construct a synthetic image by a multir...
Georgii Khachaturov, Rafael Moncayo-Muños
ADVIS
2004
Springer
14 years 29 days ago
On Families of New Adaptive Compression Algorithms Suitable for Time-Varying Source Data
In this paper, we introduce a new approach to adaptive coding which utilizes Stochastic Learning-based Weak Estimation (SLWE) techniques to adaptively update the probabilities of t...
Luís G. Rueda, B. John Oommen
ASPDAC
2006
ACM
128views Hardware» more  ASPDAC 2006»
14 years 29 days ago
A new test and characterization scheme for 10+ GHz low jitter wide band PLL
- This paper presents a new test and characterization scheme for 10+ GHz low jitter wide band PLL in 90 nm partially depleted (PD) Silicon-On-Insulator (SOI) CMOS technology. We me...
Kazuhiko Miki, David Boerstler, Eskinder Hailu, Ji...
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