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» A New Approach for Low Power Scan Testing
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VLSID
2004
IEEE
135views VLSI» more  VLSID 2004»
14 years 7 months ago
Design of Low Voltage Low Power CMOS OP-AMPS with Rail-to-Rail Input/Output Swing
Abstract--A novel input and output biasing circuit to extend the input common mode (CM) voltage range and the output swing to rail-to-rail in a low voltage op-amp in standard CMOS ...
S. V. Gopalaiah, A. P. Shivaprasad, Sukanta K. Pan...
MICCAI
2006
Springer
14 years 8 months ago
Patient Position Detection for SAR Optimization in Magnetic Resonance Imaging
Although magnetic resonance imaging is considered to be non-invasive, there is at least one effect on the patient which has to be monitored: The heating which is generated by absor...
Andreas Keil, Christian Wachinger, Gerhard Brinker...
CVPR
2010
IEEE
14 years 3 months ago
3D Shape Scanning with a Time-of-Flight Camera
We describe a method for 3D object scanning by aligning depth scans that were taken from around an object with a time-of-flight camera. These ToF cameras can measure depth scans ...
Christian Theobalt, Yan Cui, Sebastian Schuon, Seb...
IPPS
2002
IEEE
14 years 9 days ago
Massively Parallel Solutions for Molecular Sequence Analysis
In this paper we present new approaches to high performance protein database scanning on two novel massively parallel architectures to gain supercomputer power at low cost. The ï¬...
Bertil Schmidt, Heiko Schröder, Manfred Schim...
ICCAD
2004
IEEE
101views Hardware» more  ICCAD 2004»
14 years 4 months ago
Frugal linear network-based test decompression for drastic test cost reductions
— In this paper we investigate an effective approach to construct a linear decompression network in the multiple scan chain architecture. A minimal pin architecture, complemented...
Wenjing Rao, Alex Orailoglu, G. Su