465 search results - page 21 / 93 » A New Approach for Low Power Scan Testing |
CVPR
2005
IEEE
14 years 11 months ago
2005
IEEE
We address the problem of segmenting 3D scan data into objects or object classes. Our segmentation framework is based on a subclass of Markov Random Fields (MRFs) which support ef...
WONS
2005
IEEE
14 years 3 months ago
2005
IEEE
Energy is a limited resource in wireless sensor networks. In fact, the reduction of power consumption is crucial to increase the lifetime of low power sensor networks. Several app...
ISVLSI
2003
IEEE
14 years 3 months ago
2003
IEEE
The need for small, high speed, low power computers as the end of Moore’s law approaches is driving research into nanotechnology. These novel devices have significantly differe...
CORR
2010
Springer
13 years 10 months ago
2010
Springer
In this paper a new solution is proposed for testing simple stwo stage electronic circuits. It minimizes the number of tests to be performed to determine the genuinity of the circ...
DATE
2005
IEEE
14 years 3 months ago
2005
IEEE
A technique for evaluating noise figure suitable for BIST implementation is described. It is based on a low cost single-bit digitizer, which allows the simultaneous evaluation of ...