465 search results - page 7 / 93 » A New Approach for Low Power Scan Testing |
DAC
1997
ACM
13 years 11 months ago
1997
ACM
An ATPG technique is proposed that reduces heat dissipation during testing of sequential circuits that have full-scan. The objective is to permit safe and inexpensive testing of l...
IROS
2007
IEEE
14 years 1 months ago
2007
IEEE
— Toward obtaining a compact and multiresolution representation of 2D range scans, a wavelet framework is proposed for encoding an orientation measure called Running Angle (RA). ...
TC
2008
13 years 7 months ago
2008
A low-transition test pattern generator, called the low-transition linear feedback shift register (LT-LFSR), is proposed to reduce the average and peak power of a circuit during te...
ICCD
2006
IEEE
14 years 4 months ago
2006
IEEE
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...
VTS
2000
IEEE
13 years 11 months ago
2000
IEEE
Excessive switching activity during scan testing can cause average power dissipation and peak power during test to be much higher than during normal operation. This can cause prob...