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JAVACARD
2000
15 years 8 months ago
Automatic Test Generation for Java-Card Applets
: Open-cards have introduced a new life cycle for smart card embedded applications. In the case of Java Card, they have raised the problem of embedded object-oriented applet valida...
Hugues Martin, Lydie du Bousquet
AAAI
2007
15 years 6 months ago
A Model-based Approach for Merging Prioritized Knowledge Bases in Possibilistic Logic
This paper presents a new approach for merging prioritized knowledge bases in possibilistic logic. Our approach is semantically defined by a model-based merging operator in propo...
Guilin Qi
DATE
2005
IEEE
110views Hardware» more  DATE 2005»
15 years 10 months ago
Rapid Generation of Thermal-Safe Test Schedules
Overheating has been acknowledged as a major issue in testing complex SOCs. Several power constrained system-level DFT solutions (power constrained test scheduling) have recently ...
Paul M. Rosinger, Bashir M. Al-Hashimi, Krishnendu...
MOR
2010
91views more  MOR 2010»
15 years 2 months ago
Bounding Probability of Small Deviation: A Fourth Moment Approach
In this paper we study the problem of bounding the value of the probability distribution function of a random variable X at E[X] + a where a is a small quantity in comparison with...
Simai He, Jiawei Zhang, Shuzhong Zhang
GECCO
2007
Springer
196views Optimization» more  GECCO 2007»
15 years 10 months ago
An estimation of distribution algorithm with guided mutation for a complex flow shop scheduling problem
An Estimation of Distribution Algorithm (EDA) is proposed to approach the Hybrid Flow Shop with Sequence Dependent Setup Times and Uniform Machines in parallel (HFSSDST-UM) proble...
Abdellah Salhi, José Antonio Vázquez...