3481 search results - page 4 / 697 » A New Approach to Component Testing |
DATE
2003
IEEE
14 years 3 months ago
2003
IEEE
We propose a new approach to test generation and test compaction for scan circuits that eliminates the distinction between scan operations and application of primary input vectors...
ICSE
2003
IEEE-ACM
14 years 10 months ago
2003
IEEE-ACM
Software system faults are often caused by unexpected interactions among components. Yet the size of a test suite required to test all possible combinations of interactions can be...
DATE
2000
IEEE
14 years 2 months ago
2000
IEEE
Process variation has forever been the major fail cause of analog circuit where small deviations in component values cause large deviations in the measured output parameters. This...
RULEML
2007
Springer
14 years 3 months ago
2007
Springer
Nowadays the increasing complexity of cars has become a major challenge due to the growing rate of electronic components and software. This trend has an impact on all phases of the...
HASE
2002
IEEE
14 years 2 months ago
2002
IEEE
Components (in-house or pre-fabricated) are increasingly being used to reduce the cost of software development. Given that these components may not have not been developed with de...