945 search results - page 19 / 189 » A New Method for Design of Robust Digital Circuits |
APCSAC
2003
IEEE
14 years 1 months ago
2003
IEEE
This paper discusses the use of signed-digit representations in the implementation of fast and efficient residue-arithmetic units. Improvements to existing signed-digit modulo adde...
VLSID
2005
IEEE
14 years 8 months ago
2005
IEEE
Modern digital circuits consist of logic gates implemented in the complementary metal oxide semiconductor (CMOS) technology. The time taken for a logic gate output to change after...
DSD
2008
IEEE
14 years 2 months ago
2008
IEEE
Testability is one of the most important factors that are considered during design cycle along with reliability, speed, power consumption, cost and other factors important for a c...
GECCO
2003
Springer
14 years 28 days ago
2003
Springer
This poster paper summarizes our research on fault tolerance arising as a by-product of the evolutionary computation process. Past research has shown evidence of robustness emergin...
ICCAD
1999
IEEE
14 years 8 hour ago
1999
IEEE
Deep submicron technology calls for new design techniques, in which wire and gate delays are accounted to have equal or nearly equal effect on circuit behaviour. Asynchronous spee...