371 search results - page 5 / 75 » A New Method for Interoperability Test Generation |
ICST
2008
IEEE
14 years 1 months ago
2008
IEEE
This paper introduces a new method for generating test data that combines the benefits of equivalence partitioning, boundary value analysis and cause-effect analysis. It is suitab...
ICCAD
1994
IEEE
13 years 11 months ago
1994
IEEE
Existing built-in self test (BIST) strategies require the use of specialized test pattern generation hardware which introduces signi cant area overhead and performance degradation...
ECOOP
2006
Springer
13 years 11 months ago
2006
Springer
A test case consists of two parts: a test input to exercise the program under test and a test oracle to check the correctness of the test execution. A test oracle is often in the f...
DATE
1999
IEEE
13 years 11 months ago
1999
IEEE
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
BMCBI
2006
13 years 7 months ago
2006
Background: The identification of biologically interesting genes in a temporal expression profiling dataset is challenging and complicated by high levels of experimental noise. Mo...