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SBCCI
2005
ACM
14 years 1 months ago
2005
ACM
Gate oxide tunneling current Igate and sub-threshold current Isub dominate the leakage of designs. The latter depends on threshold voltage Vth while Igate vary with the thickness ...
ICCAD
2006
IEEE
14 years 4 months ago
2006
IEEE
Soft errors in logic are emerging as a significant reliability problem for VLSI designs. This paper presents novel circuit optimization techniques to mitigate soft error rates (SE...
ICCAD
2003
IEEE
14 years 4 months ago
2003
IEEE
The recent past has seen a tremendous increase in the size of design circuits that can be implemented in a single FPGA. These large design sizes significantly impact cycle time du...
CIBCB
2007
IEEE
13 years 9 months ago
2007
IEEE
—In metabolic engineering it is difficult to identify which set of genetic manipulations will result in a microbial strain that achieves a desired production goal, due to the co...
DAC
2009
ACM
14 years 11 days ago
2009
ACM
The progress of GPU (Graphics Processing Unit) technology opens a new avenue for boosting computing power. This work is an attempt to exploit GPU for accelerating VLSI circuit opt...