Abstract— Process variations make at-speed testing significantly more difficult. They cause subtle delay changes that are distributed rather than the localized nature of a trad...
Vladimir Zolotov, Jinjun Xiong, Hanif Fatemi, Chan...
Parametric yield loss due to variability can be effectively reduced by both design-time optimization strategies and by adjusting circuit parameters to the realizations of variable...
Murari Mani, Ashish Kumar Singh, Michael Orshansky
Abstract— Continuing scaling of CMOS technology has allowed aggressive pursuant of increased clock rate in DSM chips. The ever shorter clock period has made switching times of di...
We present efficient algorithms for computing very sparse low distortion spanners in distributed networks and prove some non-trivial lower bounds on the tradeoff between time, spar...
The main contribution of this paper is an optimal bounded space online algorithm for variable-sized multidimensional packing. In this problem, hyperboxes must be packed in ddimens...