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DATE
2009
IEEE
145views Hardware» more  DATE 2009»
14 years 3 months ago
Joint logic restructuring and pin reordering against NBTI-induced performance degradation
Negative Bias Temperature Instability (NBTI), a PMOS aging phenomenon causing significant loss on circuit performance and lifetime, has become a critical challenge for temporal re...
Kai-Chiang Wu, Diana Marculescu
ETS
2006
IEEE
119views Hardware» more  ETS 2006»
14 years 2 months ago
On-Chip Test Generation Using Linear Subspaces
A central problem in built-in self test (BIST) is how to efficiently generate a small set of test vectors that detect all targeted faults. We propose a novel solution that uses l...
Ramashis Das, Igor L. Markov, John P. Hayes
CAIP
2007
Springer
202views Image Analysis» more  CAIP 2007»
14 years 2 months ago
Segmentation of Distinct Homogeneous Color Regions in Images
Abstract. In this paper, we present a novel algorithm to detect homogeneous color regions in images. We show its performance by applying it to skin detection. In contrast to previo...
Daniel Mohr, Gabriel Zachmann
FUZZIEEE
2007
IEEE
14 years 2 months ago
Distance Measure Assisted Rough Set Feature Selection
Abstract— Feature Selection (FS) is a technique for dimensionality reduction. Its aims are to select a subset of the original features of a dataset which are rich in the most use...
Neil MacParthalain, Qiang Shen, Richard Jensen
NAACL
2004
13 years 10 months ago
A Statistical Model for Multilingual Entity Detection and Tracking
Entity detection and tracking is a relatively new addition to the repertoire of natural language tasks. In this paper, we present a statistical language-independent framework for ...
Radu Florian, Hany Hassan, Abraham Ittycheriah, Ho...