95 search results - page 5 / 19 » A Novel Functional Test Generation Method for Processors Usi... |
193
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DAC
1996
ACM
15 years 8 months ago
1996
ACM
- Functional verification of the new generation microprocessor developed by SGS-THOMSON Microelectronics makes extensive use of advanced technologies. This paper presents a global ...
132
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KBSE
2008
IEEE
15 years 10 months ago
2008
IEEE
We present a novel approach for black-box testing of database management systems (DBMS) using the Alloy tool-set. Given a database schema and an SQL query as inputs, our approach ...
173
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IFIP
2001
Springer
15 years 8 months ago
2001
Springer
— Semi-formal verification based on symbolic simulation offers a good compromise between formal model checking and numerical simulation. The generation of functional test vector...
152
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EURODAC
1994
IEEE
15 years 8 months ago
1994
IEEE
This paper presents a testability improvement method for digital systems described in VHDL behavioral specification. The method is based on testability analysis at registertransfe...
128
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KBSE
2002
IEEE
15 years 8 months ago
2002
IEEE
Generating test inputs for a path in a function with integer and real parameters is an important but difficult problem. The problem becomes more difficult when pointers are pass...