95 search results - page 5 / 19 » A Novel Functional Test Generation Method for Processors Usi... |
DAC
1996
ACM
14 years 1 days ago
1996
ACM
- Functional verification of the new generation microprocessor developed by SGS-THOMSON Microelectronics makes extensive use of advanced technologies. This paper presents a global ...
KBSE
2008
IEEE
14 years 2 months ago
2008
IEEE
We present a novel approach for black-box testing of database management systems (DBMS) using the Alloy tool-set. Given a database schema and an SQL query as inputs, our approach ...
IFIP
2001
Springer
14 years 10 days ago
2001
Springer
— Semi-formal verification based on symbolic simulation offers a good compromise between formal model checking and numerical simulation. The generation of functional test vector...
EURODAC
1994
IEEE
14 years 1 days ago
1994
IEEE
This paper presents a testability improvement method for digital systems described in VHDL behavioral specification. The method is based on testability analysis at registertransfe...
KBSE
2002
IEEE
14 years 25 days ago
2002
IEEE
Generating test inputs for a path in a function with integer and real parameters is an important but difficult problem. The problem becomes more difficult when pointers are pass...