590 search results - page 10 / 118 » A Novel Method to Improve the Test Efficiency of VLSI Tests |
DATE
2010
IEEE
14 years 17 days ago
2010
IEEE
—Time-dependent performance degradation due to transistor aging caused by mechanisms such as Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) is one o...
CC
2005
Springer
14 years 1 months ago
2005
Springer
Software testing to produce reliable and robust software has become vitally important in recent years. Testing is a process by which software quality can be assured through the co...
IJIIDS
2008
13 years 7 months ago
2008
: Main aim of Intelligent Transport Systems (ITS) applied to roads is to increase their safety. To achieve this aim, many researchers are focused on developing robust and efficient...
TIT
2002
13 years 7 months ago
2002
Abstract--We adapt methods originally developed in information and coding theory to solve some testing problems. The efficiency of two-stage pool testing of items is characterized ...
TCAD
2002
13 years 7 months ago
2002
Test scheduling is an important problem in system-on-a-chip (SOC) test automation. Efficient test schedules minimize the overall system test application time, avoid test resource c...