590 search results - page 22 / 118 » A Novel Method to Improve the Test Efficiency of VLSI Tests |
PKC
2009
Springer
14 years 8 months ago
2009
Springer
Recently, the new Multibase Non-Adjacent Form (mbNAF) method was introduced and shown to speed up the execution of the scalar multiplication with an efficient use of multiple bases...
VLDB
2007
ACM
14 years 1 months ago
2007
ACM
Testing a database engine has been and continues to be a challenging task. The space of possible SQL queries along with their possible access paths is practically unbounded. Moreo...
DFT
1999
IEEE
13 years 12 months ago
1999
IEEE
In this paper, we present a memory fault simulator called the Random Access Memory Simulator for Error Screening (RAMSES). Although it was designed based on some wellknown memory ...
VLSID
2004
IEEE
14 years 8 months ago
2004
IEEE
: The accumulation of popular features in portable products such as mobile handsets is driving battery life to unacceptably low levels. Substantial change will not come from increm...
IAJIT
2010
13 years 4 months ago
2010
: Finite Radon Transform mapper has the ability to increase orthogonality of sub-carriers, it is non sensitive to channel parameters variations, and has a small constellation energ...