590 search results - page 35 / 118 » A Novel Method to Improve the Test Efficiency of VLSI Tests |
ADMA
2010
Springer
13 years 2 months ago
2010
Springer
We introduce a novel approach to incremental e-mail categorization based on identifying and exploiting "clumps" of messages that are classified similarly. Clumping reflec...
VLSID
2007
IEEE
14 years 8 months ago
2007
IEEE
As technology scales to 40nm and beyond, intra-die process variability will cause large delay and leakage variations across a chip in addition to expected die-to-die variations. I...
OWLED
2008
13 years 9 months ago
2008
Abstract. HermiT is a new OWL reasoner based on a novel "hypertableau" calculus. The new calculus addresses performance problems due to nondeterminism and model size--the...
DFT
2003
IEEE
14 years 1 months ago
2003
IEEE
For system-on-chip designs that contain an embedded processor, this paper present a software based diagnosis scheme that can make use of the processor to aid in diagnosis in a sca...
SMA
2008
ACM
13 years 7 months ago
2008
ACM
We present an interactive algorithm for continuous collision detection between deformable models. We introduce two techniques to improve the culling efficiency and reduce the numb...